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楼海君

职称:研究员

毕业院校:北京大学

邮件:louhj04@hdu.edu.cn

办公地点: 教四704

职务:

研究方向: 紫外探测器件、系统及空间环境可靠性

个人简介

楼海君,正高,博士生导师/硕士生导师,浙江大学兼任教师,北京大学博士,立足航空航天和芯片领域的交叉,开展智能电子系统及嵌入式、宽禁带半导体紫外探测器和多场耦合等研究工作,具有丰富的科研和产业双重背景。研发了基于碳化硅雪崩二极管和基于像增强器两种紫外探测系统,面向电晕检测、海上搜救、红紫融合和非视距通信开展智能算法的研究,积极探索紫外的系统级应用;为了保障高性能工业级器件在轨的长期工作,研发了针对卫星总剂量影响的三维评估系统和单粒子翻转评估系统,建立了完整的可靠性体系和空间环境防护体系,研制了五型卫星的电源系统和基于GPU的抗辐射星载图像处理系统;建立了基于分子动力学、蒙特卡洛和有限元的跨尺度仿真方法表征器件的应力-热-辐照多场耦合影响。在IEEE Transactions on Electron Devices、Physical Chemistry Chemical Physics等期刊和会议上共发表论文40余篇,撰写书籍章节2篇、专利十余个。先后主持包括国家自然科学基金在内的国家级项目6项,3项重大专项子课题负责人,曾获得军队科技进步三等奖(排名第一)和深圳市科学技术奖自然科学类二等奖(排名第四)。此外还担任IEEE Transactions on Electron Devices、IEEE Transactions on Nanotechnology、Semiconductor Science and Technology、Journal of Physics: Condensed Matter等期刊审稿人,是IEEE EDS/SSCS Shenzhen Chapter创始人之一。

◇招收博士后、博士和硕士研究生,欢迎加入我们的大家庭,希望:

◎对宽禁带器件/紫外探测系统/ARM+FPGA嵌入式等领域充满热忱 ◎追求卓越和高效,发表突破性成果 ◎渴望从器件到系统的全链条创新 ◎追求科研成果落地

教育经历

2004-2008 兰州大学物理科学与技术学院

2009-2014 北京大学信息科学技术学院


工作经历

2018.10-2024.02 浙江大学先进技术研究院

2024.03-至今  杭州电子科技大学电子信息学院

社会职务
研究领域

紫外探测器件、系统及空间环境可靠性

教学与课程
横向科研

1、新型高效太阳电池搭载平台研发,项目负责人(中电18所),60万,已结题

2、可见光、紫外融合算法与软件开发,项目负责人,105万,在研

3、面向碳化硅APD紫外探测器信号处理电路开发,项目负责人,25万,在研

4、声特性数据分析管理模块开发,项目负责人,56万,在研

5、目标光学特性数据样本库构建技术,项目负责人,110万,已结题

纵向科研

1、基于TSV转接板的射频集成关键技术,项目主持人,40万,已结题

2、碳化硅XX探测器抗辐照及加固技术基础研究,项目主持人,80万,已结题

3、空间环境对微纳卫星中高性能芯片影响及防护,项目主持人(中央高校项目),15万,已结题

4、沟道工艺偏差对亚10纳米无结FinFET输运效率的影响及机理研究,项目主持人(国家自然基金项目青年基金),24万,已结题

5、XX研制及试验,子课题负责人,498万,已结题

6、微纳卫星XXXX验证,子课题负责人,317万,已结题

7、空间环境对智能飞行器中高性能芯片的影响及防护,子项目负责人(浙江大学智能飞行器系统与工程优势特色学科项目),25万,已结题

8、飞行X智能模块研制,参与人,90万,已结题

9、面向电晕监测的固态紫外单光子探测技术研究,项目负责人,15万,在研

论文

[1]. Qicong Li, Haijun Lou* and Linli Zhu*, Strain effect on the performance of proton‑irradiated GaN‑based HEMT, Applied Physics A (2023) 129:374.

[2]. 佘璇,楼海君*,宋仁庭,李琪聪,金仲和,微纳卫星总剂量评估优化研究,北京航空航天大学学报.

[3].  Yumei Yang, Haijun Lou*, Interfacial Shearing and Transverse Normal Stress in a Superconducting Coated Conductor Strip with Combined Transport Current and Magnetic Field, Journal of Superconductivity and Novel Magnetism volume 36, pages821–829 (2023).

[4]. Wentao Li, Haijun Lou* and Xinnan Lin*, Investigation of trench process variation on the recessed-gate junctionless MOSFETs considering the circuit application, Semicond. Sci. Technol. 35 (2020) 085002 (10pp).

[5].  Gengshu Wu, Haijun Lou*, Kai Liu and Xinnan Lin*, The study of bending properties of monolayer MoS2 in non-collinear electrodes using first principles theory, Phys. Chem. Chem. Phys., 2020, 22, 21888-21892.

[6].  Luodan Hu, Haijun Lou*, Wentao Li, Kuan-Chang Chang*, Xinnan Lin*, Suppression of Statistical Variability in Junctionless FinFET Using Accumulation-Mode and Charge Plasma Structure, IEEE Transactions on Electron Devices, 2020-11, 68, 1, 399-404.

[7].Yumei Yang, Haijun Lou*, Xinnan Lin, High-k Spacer Consideration Of Ultra-scaled Gate-All-Around Junctionless Transistor In Ballistic Regime, IEEE Transactions on Electron Devices. Vol. 65, No. 12, pp. 5282-5288, Dec. 2018.

[8].Wenbo Wan, Haijun Lou*, Ying Xiao and Xinnan Lin*, Source/Drain Engineered Charge-Plasma Junctionless Transistor for the Immune of Line Edge Roughness Effect, IEEE Transactions on Electron Devices. Vol. 65, No. 5, pp. 1873-1879, May 2018.

[9].Peng Xu, Haijun Lou*, Lining Zhang, Zhonghua Yu and Xinnan Lin*, “Compact Model for Double-Gate Tunnel FETs With Gate Drain Underlap”, IEEE Transactions on Electron Devices, Dec. 2017. No. 64 Issue:12, PP5242-5248.

[10].Ying Xiao, Baili Zhang, Haijun Lou*, Lining Zhang, Xinnan Lin*. A compact model of subthreshold current with source/drain depletion effect for the short-channel junctionless cylindrical surrounding-gate MOSFETs. IEEE Transactions on Electron Devices, 63(5), 2176-2181(2016).

[11].Ying Xiao, Xinnan Lin*, Haijun Lou*, Baili Zhang, Lining Zhang and Mansun Chan. A Short Channel Double-Gate Junctionless Transistor Model Including the Dynamic Channel Boundary Effect. IEEE Transactions on Electron Devices, 63(12), 4661-4667(2016).

[12].Xinnan Lin*, Baili Zhang, Ying Xiao, Haijun Lou*, Lining Zhang and Mansun Chan. Analytical current model for long-channel junctionless double-gate MOSFETs. IEEE Transactions on Electron Devices, 63(3), 959-965(2016).

[13].Haijun Lou, Baili Zhang, Dan Li, Xinnan Lin, Jin He and Mansun Chan, Suppression of subthreshold characteristics variation for junctionless multigate transistors using high-k spacers, Semicond. Sci. Technol. 30 (2015) 015008 (7pp).

[14].Haijun Lou, Dan Li, Yan Dong, Xinnan Lin, Jin He, Shengqi Yang and Mansun Chan, Suppression of Tunneling Leakage Current in Junctionless Nanowire Transistors, Semicond. Sci. Technol.28 (2013) 125016 (6pp)

[15].Haijun Lou, Dan Li, Yan Dong, Xinnan Lin, Shengqi Yang, Jin He, and Mansun Chan, Effects of Fin Sidewall Angle on Subthreshold Characteristics of Junctionless Multigate Transistors,Jpn. J. Appl. Phys. 52 (2013) 104302

[16].Haijun Lou, Binghua Li, Xinnan Lin, Jin He, Mansun Chan, Investigations of fin vertical nonuniformity effects on junctionless multigate transistor. Environmental Science and Technology, 46, 17 (2012) , 9709-9715.

[17].Haijun Lou, Lining Zhang, Yunxi Zhu, Xinnan Lin, Shengqi Yang, Jin He and Mansun Chan, A Junctionless Nanowire Transistor With Dual-Material-Gate, IEEE Transactions on Electron Devices,Jul. 2011. No. 59 Issue:7, PP1829 – 1836.


著作

[1].Jin He, Haijun Lou, Lining Zhang and Mansun Chan, Silicon-Based Nanowire MOSFETs: From Process and Device Physics to Simulation and Modeling, in Nanowires - Implementations and Applications, A. Hashim, Ed.: InTech, July 2011.

[2].Xinnan Lin, Haijun Lou, Ying Xiao, Wenbo Wan, Lining Zhang and Mansun Chan. Silicon-Based Junctionless MOSFETs: Device Physics, Performance Boosters and Variations. In Outlook and Challenges of Nano Devices, Sensors, and MEMS (pp. 183-236). Springer International Publishing (2017).

专利成果

[1].楼海君,马志鹏,金仲和,专利申请号:2019108916108一种半封闭式星载芯片散热装置

[2].楼海君,涂实磊,王慧泉,金仲和,专利申请号:202011058352.4,“一种星载NAND FLASH存储管理系统”(已授权)

[3].楼海君,李萱,金仲和,专利申请号:2022101609295,一种面向Zynq芯片的单配置帧级故障检测与刷新方法

[4].李萱,楼海君,金仲和,专利申请号:2021113764579,一种基于Zynq芯片的自动化故障注入系统及方法

[5].楼海君,林信南,何进,专利申请号:201110424189.3无结纳米线场效应晶体管

[6].楼海君,林信南,李冰华,何进,专利申请号:201210232954.6一种无结场效应晶体管(已授权)

[7].楼海君,林信南,李丹,何进,专利申请号:201310403969.9遂穿场效应晶体管(已授权,PCT

[8].万文波,楼海君,肖颖,林信南,专利申请号:201710059574.X一种无结型场效应晶体管(已授权)

荣誉及奖励
1、军队科技进步三等奖(1/6)


软件成果